Wafer defect triage
I compared a random forest and a small CNN on WM-811K wafer maps. The random forest’s drop on the test split led me to investigate differences between batches and performance on rare defects.
What am I testing next?
Next I’ll test how to use model scores to prioritize reinspection. If only 200 of every 1,000 wafers can be checked, how many defects would the ranking catch, and which rare defects would it miss?